LD Temperature Characteristic Measuring Device
Model name／ WLC-A4
Abstruct
The realization of a unique light guide optical system eliminates the need for a complicated alignment and aiming mechanism in conventional low-temperature environments, and
allows the system to measure the emission/reception characteristics of LD and PD elements placed under multiple temperature points from -40°C to 90°C
at high speed.
A high-power Peltier element provides high accuracy and a fast temperature rise and fall environment.
The compact measurement structure ensures maximum stability and reproducibility of various measurement indices.
Characteristicks
This system can automatically measure L&I, V&I, Im&L of LD modules (TOCAN φ5.6, etc.), Im, Idark of PD elements, and spectral characteristics (wave amplitude, SMSR, etc.) at various temperature points from -40°C to 90°C.
Specifications
| Item | Specifications | |
|---|---|---|
| Elements for measurement | Shape | 5.6mmφCAN type (other shapes are available) |
| Wave length | 0.9~1.7μm | |
| Measurement Item | LD | L(Po),Vf,Ir |
| PD | Im,Idark | |
| Characteristic Curves | L&I, V&I, Im&L curves | |
| Spectrum Analysis | Center width, peak width, spectral width, SMSR, etc. | |
Applications
It has been adopted in the manufacturing process of BOX-type optical transmitter/receiver devices for optical communications and is now in operation as mass production equipment.